2019

[49] Hyeonsu Cho, Kihyun Kim, Chang-Ki Baek, “Structural and sensing characteristics of lanthanum fluoride membrane for fluoride ion sensor”, International Conference on Electronics, Information and Communication (ICEIC), Auckland, New Zealand, Jan. 22-25, 2019.

[48] Myunghae Seo, Kihyun Kim, Chang-Ki Baek, “Silicon Nanowire based Resonators for Increasing Near-infrared Light Absorption”, International Conference on Electronics, Information, and Communication (ICEIC), Auckland, New Zealand, Jan. 22-25, 2019.

2017

[47] Hyunah Kwon, Jun-Sik Yoon, Yuna Lee, Dong Yeong Kim, Chang-Ki Baek, Jong Kyu Kim, “An array of metal oxides nanoscale hetero p-n junctions toward designable and highly-selective gas sensors”, The 2017 MRS Fall Meeting & Exhibit, Boston, MA, USA., Nov. 26-Dec. 1, 2017.

[46] Hyeonsu cho, Kihyun Kim, Chang-Ki Baek, “Noise Characteristics of Silicon Nanowire ISFET Sensors with different channel doping concentration”, NanoBioSensors Conference, Dresden, Germany, Sep. 4-5, 2017.

[45] Jun-Sik Yoon, Kihyun Kim, Chang-Ki Baek, “Silicon Tunneling Field-Effect Transistors having Core-Shell Structure”, The 15th International Nanotech Symposium & Nano-Convergence Expo, Ilsan, Korea, Jul. 12-14, 2017.

[44] Sol Yoon, Kihyun Kim, Hyeonsu Cho, Junsik Yoon, M. Meyyappan, Chang-Ki Baek, “Investigation of nano-scale grain boundary effect on polysilicon near-infrared photodetector”, The 15th International Nanotech Symposium & Nano-Convergence Expo, Ilsan, Korea, Jul. 12-14, 2017.

[43] Seungho Lee, Kihyun Kim, Myunghae Seo, Jun-Sik Yoon, Meyya Meyyappan, Chang-Ki Baek, “Thermal conductivity analysis of vertical Si nanowire array using differential 3ω method”, The 15th International Nanotech Symposium & Nano-Convergence Expo, Ilsan, Korea, Jul. 12-14, 2017.

[42] Wooju Jeong, Kanghyun Kim, Jun-Sik Yoon, Kihyun Kim, Meyya Meyyappan, Chang-Ki Baek, “Gas sensitivity analysis of single ZnO nanowire gas sensor having different defect density, dimension and material properties”, The 15th International Nanotech Symposium & Nano-Convergence Expo, Ilsan, Korea, Jul. 12-14, 2017.

[41] Bergoi Ibarlucea, Teuku Fawzul Akbar, Kihyun Kim, Taiuk Rim, Chang-Ki Baek, Alon Ascoli, Ronald Tetzlaff, Larysa Baraban, Gianaurelio Cuniberti, “Ebola biosensing with a gate controlled memristor mode”, The 18th Trends in Nanotechnology International Conference(TNT2017), Dresden, Germany, June. 5-9, 2017.

[40] Kihyun Kim, Chang-Ki Baek, “Silicon Nanowire Based Thermoelectric Device for Energy Harvesting”, IEEE International Conference on Nanotechnology, Pittsburgh, PA, USA., Jul. 25-28, 2017 (Invited paper)

[39] Kihyun Kim, Sol Yoon, Seungho Lee, M. Meyyappan, and Chang-Ki Baek, “Silicon-based near infrared photodetector with high responsivity”, 2017 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices, Gyeongju, Korea, Jul. 3-5, 2017. (Invited paper)

[38] Jun-Sik Yoon, Kihyun Kim, and, Chang-Ki Baek, “Silicon-based Tunneling Field-Effect Transistors for Ultra-low Power Applications”, 2017 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices, Gyeongju, Korea, Jul. 3-5, 2017. (Invited paper)

2016

[37] Chang-Ki Baek, “Energy and Sensor Applications based on Silicon Nanotechnology”, IEEE International Conference on Nanotechnology, Sendai, Japan, Aug. 22-25, 2016. (Keynote speaker)

[36] Jun-Sik Yoon, Seungho Lee, Sol Yoon, Kihyun Kim, Taiuk Rim, Chang-Ki Baek, “Simulation and characterization of electronic and photonic devices using silicon nanowire structure”, 2016 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices, Hakodate, Japan, Jul. 4-6, 2016.

2015

[35] Taiuk Rim, Kihyun Kim, Taiuk Rim, Chang-Ki Baek, “Honeycomb Nanowire Field Effect Transistor Sensor and Its Applications”, 2015 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices, Jeju, Korea, Jun. 29-Jul. 1, 2015.

2014

[34] Jungsik Kim, Hyeongwan Oh, Junyoung Lee, Bo Jin, Taiuk Rim, Chang-Ki Baek, M. Meyyappan, Jeong-Soo Lee, “The Temperature Dependence of Threshold Voltage Variations due to Oblique Sing Grain Boundary in 3D NAND unit Cells”, Non-Volatile Memory Technology Symposium, Jeju, Korea, Oct. 27-29, 2014.

[33] Jungsik Kim, Chang-Ki Baek, Junyoung, Lee, Taiuk Rim, M. Meyyappan, Hyeongwan Oh, Jeong-Soo Lee, “The Variability due to Random Discrete Dopant and Grain Boundaryin 3D NAND Unit Cell”, The 6th IEEE International Nanoelectronics Conference, Sapporo, Japan, Jul. 28-31, 2014.

[32] Taiuk Rim, Sungho Kim, Nanki Hong, Jeong-Soo Lee, Yoon-Ha Jeong, M. Meyyapan, Chang-Ki Baek, “Noise Consideration for Cancer Marker Detection using Nanowire Sensors”, IEEE Nano: 14th International Conference on Nanotechnology, Toronto, Canada, Aug. 18-21, 2014.

 (Before POSTECH professor appointment)

2013

[31] Chang-Ki Baek, Myung-Dong Ko, Taiuk Rim, “Silicon Nanowire and its Application”, 2013 Asia-Pacific Worksi on Fundamentals and Applications of Advanced Semiconductor Devices, Seoul, Korea, Jun. 26-28, 2013. (Invited speaker)

[30] Sang-Hyun Lee, Ye-Ram Kim, Jae-Ho Hong, Eui-Young Jeong, Jun-Woo Jang, Jun-Sik Yoon, Dong-Won Kim, Chang-Ki Baek, Jeong-Soo Lee, and Yoon-Ha Jeong, “Characterization of Low Frequency Noise in Nanowire FETs Considering Variability and Quantum Effects”, 2013 Annual Device Research Conference(DRC), South Bend, IN, USA., Jun. 23-26, 2013.

2012

[29] Myung-Dong Ko, Taiuk Rim, Chang-Ki Baek, Dae Mann Kim, and Yoon-Ha Jeong, “Characterization of Silicon Nanowire Biosensors and Solar Cells”, 2012 International Conference on Solid State and Device Materials, Xi’an, China, Oct. 29-Nov. 1, 2012.

[28] S. Choi, Y. J. Park, Chang-Ki Baek, S. Park, “An Improved 3D Monte Carlo Simulation of Reaction Diffusion Model for Accurate Prediction of the NBTI Stress/Relaxation”, The 17th International Conference on Simulation of Semiconductor Processes and Devices, Denver, CO, USA., Sep. 5-7, 2012.

[27] C.-W. Sohn, C. Y. Kang, R.-H. Baek, P. Kirsh, R. Jammy, M.-D Ko, D.-Y. Choi, H. C. Sagong, E.-Y. Jeong, Chang-Ki Baek, J.-S. Lee, Y.-H. Jeong, J. C. Lee, “Modeling and Analysis of the Parasitic Series 15-3 Resistance in Raised Source/Drain FinFETs with Polygonal Shaped Epitaxy”, The 17th International Conference on Simulation of Semiconductor Processes and Devices, Denver, CO, USA., Sep. 5-7, 2012.

[26] Taiuk Rim, Kihtun Kim, Eunhye Baek, Unsang Lee, Nankin Hong, Chang-Ki Baek, Sooyoung Park, Jeong-Soo Lee, Yoon-Ha Jeong, “Determination of Operation Region in Silicon Nanowire BioFETs to Maximize Single-to-Noise Ratio”, International Conference on Superlattices, Nanostructures and Nanodevice, Dresden, Germany, Jul. 22-27, 2012.

[25] Do-Young Choi, Chang-Woo Shon, Hyun-Chul Sagong, Eui-Young Jung, Jun-Woo Jang, Chang-Ki Baek, Jeong-Soo Lee, Yoon-Ha Jeong, “Intrinsic Reliability Improvement of SiGe Quantum Well pMOSFETs”, International Conference on Superlattices, Nanostructures and Nanodevice, Dresden, Germany, Jul. 22-27, 2012.

[24] Myung-Dong Ko, Chang-Ki Baek , Taiuk Rim, Sooyoung Park, and Yoon-HaJeong, “Si Thin Film Solar Cell with Asymmetric P-N Junction”, 38th IEEE Photovoltaic Specialists Conference, Austin, TX, USA., Jun. 3-8, 2012.

2011

[23] Y. R. Kim, S. H. Lee, Chang-Ki Baek, R. H. Baek, K. H. Yeo, D. W. Kim, J. S. Lee, and Y. H. Jeong, “Reliable Extraction of Series Resistance in Silicon Nanowire FETs Using Y-function Technique”,  2011 IEEE Nanotechnology Materials and Devices Conference, JeJu, Korea, Oct. 19-21, 2011.

[22] M. D. Ko, S. H. Lee, R. H. Baek, C. H. Park, C. W. Sohn, Chang-Ki Baek, J. S. Lee, Y. H. Jeong, “Analysis of Bottom Channel Effect in Silicon Nanowire FET based on Bulk-Silicon: Reduction of Parasitic Capacitance caused by SiGe layer”, 2011 International Conference on Solid State and Device Materials, Nagoya, Japan, Sep. 28-30, 2011.

[21] J. S. Lee, T. Rim, S. Kim, K. Kim, Chang-Ki Baek, M. Meyyappan, “Highly Sensitive BioFETs with Various Nanowire Structure”, 3M NANO, Changchun, China, Aug. 29-Sep. 2, 2011.

[20] Chan-Hoon Park, Sang-Hyun Lee, Ye-Ram Kim, Chang-Ki Baek, Yoon-Ha Jeong, “Fabrication and Characterization of Gate-All-Around Silicon Nanowire Field Effect Transistors”, 11th IEEE International Conference on Nanotechnology, Portland, OR, USA., Aug. 15-18, 2011.

[19] R. H. Baek, M. D. Ko, S. H. Lee, Chang-Ki Baek, K. H. Yeo, D. W. Kim, J. S. Lee, and Y. H. Jeong, “Analysis of Parasitic Bottom Capacitance in n- and p-type Si-Nanowire Field Effect Transistors on Bulk”, 2011 11th IEEE International Conference on Nanotechnology, Portland, OR, USA., Aug. 15-18, 2011.

[18] Chan-Hoon Park, Myung-Dong Ko, Ki-Hyun Kim, Chang-Woo Sohn, Chang-Ki Baek, Yoon-Ha Jeong and Jeong-Soo Lee, “Comparative study of fabricated junctionless and inversion-mode nanowire FETs”, 2011 69th Annual Device Research Conference(DRC), Santa Barbara, CA, USA., Jun. 20-22, 2011.

[17] Sungho Kim, Kihyun Kim, Taiuk Rim, Chanhoon Park, Donghwan Cho, Chang-Ki Baek, Yoon-Ha Jeong, Meyya Meyyappan, Jeong-Soo Lee, “pH Sensing and Noise Characteristics of Si Nanowire Ion-Sensitive Field Effect Transistors”, The 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, Kaohsiung, Taiwan , Feb. 20-23, 2011.

[16] SeongWook Choi, Sooyoung Park, Young June Park, Chang-Ki Baek, “Universal Relaxation Model for the FN stress/relaxation in the nMOSFET device”, 8th International Workshop on Compact Modeling, Yokohama, Japan, Jan. 25, 2011.

2010

[15] Yoon-Ha Jeong, Rock-Hyun Baek, Sang-Hyun Lee, Chang-Ki Baek, Kim, D.M., “Characteristics and modeling of Si-nanowire FETs”, 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology(ICSICT), Shanghai, China, Nov. 1-4, 2010.

[14] Rock-Hyun Baek, Chang-Ki Baek, Kyoung Hwan Yeo, Dong-Won Kim, Jinyong Chung, Dae Mann Kim, and Yoon-Ha Jeong, “Comparative study of C-V characteristics in Si-NWFET and MOSFET”, IEEE Nanotechnology Materials and Devices Conference, Monterey, CA, USA., Oct. 12-15, 2010.

[13] SeongWook Choi, Sooyoung Park, Young June Park, Chang-Ki Baek, “Device Lifetime Estimation under NBTI Stress Considering Interface Trap Generation”, IEEE International Conference on Nanotechnology, Ilsan, Korea, Aug. 17-20, 2010.

[12] Rock-Hyun Baek, Chang-Ki Baek, Hyun-Sik Choi, Hyun Chul Sagong, Sang-Hyun Lee, Gil-Bok Choi, Seung Hyun Song, Chan-Hoon Park, Jeong-Soo Lee, Yun Young Yeoh, Kyoung Hwan Yeo, D.-W. Kim, Kinam Kim, Dae M. Kim, and Yoon-Ha Jeong, “Characterization of Gate-All-Around Si-NWFET, including Rsd, Cylindrical Coordinate Based 1/f Noise and Hot Carrier Effects”,  IEEE 48th Annual International Reliability Physics Symposium, Anaheim, CA, USA., May. 2-6, 2010.

[11] Rock-Hyun Baek, Chang-Ki Baek, Sang-Hyun Lee, Sung Dae Suk, Yun Young Yeoh, Kyoung Hwan Yeo, Dong-Won Kim, Jeong-Soo Lee, Dae Man Kim, Yoon-Ha Jeong, “C-V Characteristics and Analysis of Undoped Gate-All-Around Nanowire FET Array”, International Conference on Solid State Devices and Materials, Tokyo, Japan, Sep. 22-24, 2010.

2009

[10] R. H. Baek, Chang-Ki Baek, S. W. Jung, Y. Y. Yeoh, D. W. Kim, J. S. Lee, D. M. Kim and Y. H. Jeong , “Series Resistance Behavior Extracted from Silicon Nanowire Transistors using the Y-function Technique”, 2009 International Conference on Solid State Devices and Materials(SSDM), Sendai, Japan, Oct. 7-9, 2009.

[9] SeongWook Choi, Chang-Ki Baek, Sooyoung Park, and Young June Park, “Simulation on NBTI degradation due to discrete interface traps with local mobility model and its statistical effects on drain current”, IEEE 14th International Conference on Simulation of Semiconductor Processes and Devices, San Diego, CA, USA., Sep. 9-11, 2009.

2008

[8] Chang-Ki Baek, SeongWook Choi, Hong-Hyun Park, Jun-Myung Woo, Sung-Min Hong, Chan Hyeong Park, and Young June Park, “A unified approach for the reliability modeling of MOSFETs”, IEEE 13th International Conference on Simulation of Semiconductor Processes and Devices, Hakone, Japan, Sep. 9-11, 2008. (Invited speaker)

[7] Chang-Ki Baek, Sooyoung Park, Hong Hyun Park, SeongWook Choi, Jun-Myung Woo and Young June Park, “3D simulation study of local mobility fluctuation on MOSFET induced by a single trapped charge in SiO2 layer”, IEEE Workshop on Compact Modeling, Hakone, Japan, Sep. 8, 2008. (Invited speaker)

[6] Hong-Hyun Park, Chang-Ki Baek, Jun-Myung Woo, Sooyoung Park, SeongWook Choi, Sung-Min Hong, Andrew Serov, and Young June Park, “Universal Reliability Modeling Strategy based on CLESICO”, 5th International Workshop on Compact Modeling, Seoul, Korea, Jan. 21, 2008.

[5] Younghwan Son, Chang-Ki Baek, Bomsoo Kim, In-Shik Han, Tae-Gyu Goo, Ooksang You, Wonho Choi, Hee-Hwan Ji, Hi-Deok Lee, and Dae M. Kim, “Characterization of Near-Interface Oxide Trap Density in Remote Plasma Nitrided Oxides for Nano-Scale MOSFETs”, IEEE Nanotechnology Materials and Devices Conference(NMDC), Kyoto, Japan, Oct. 20-22, 2008.

2007

[4] Myoung Jin Lee, Seonghoon Jin, Chang-Ki Baek, Sung-Min Hong, Soo-Young Park,Hong-Hyun Park, Sang-Don Lee, Sung-Woong Chung, Jae-Goan Jeong, Sung-Joo Hong, Sung-Wook Park, In-Young Chung, Young June Park, and Hong Shick Min, “Reliability Studies on Non Planar DRAM Cell Transistor”, IEEE 45th Annual International Reliability Physics Symposium, Phoenix, AR, USA., Apr. 15-19, 2007.

2006

[3] Myoung Jin Lee, Seonghoon Jin, Chang-Ki Baek, In-Young Chung, Young June Park, and Hong Shick Min, “A New Recessed FINFET with R-shaped side channel(RFinFET) for DRAM Cell Applications”, IEEE 2006 Silicon Nanoelectronics Workshop, Honolulu, Hawaii, USA., Jun. 11-12, 2006.

[2] Younghwan Son, Chang-Ki Baek, Bomsoo Kim, In-Shik Han, Tae-Gyu Goo, Hi-Deok Lee, and Dae Mann Kim, “Near Surface Oxide Trap Density Profiling in NO and Remote Plasma Nitrided Oxides in Nano-Scale MOSFETs, Using Multi-Temperature Charge Pumping Technique: Not vs. Oxide Processing”, 2006 International Conference on Solid State Devices and Materials(SSDM), Yokohama, Japan, Sep. 12-15, 2006.

2005

[1] Wook Hyun Kwon, Jung In Han, Bomsoo Kim, Chang-Ki Baek, Sang-Pil Sim, Wook H. Lee, Jee Hoon Han, Cheol Jung, Heon Kyu Lee, Young Kwan Jang, Jeung Hwan Park, Dae Mann Kim, Chan-Kwang Park and Kinam Kim, “Highly Reliable 256Mb NOR Flash MLC with Self-Aligned Process and Controlled Edge Profile”, 2005 International Conference on Solid State Devices and Materials(SSDM), Kobe, Japan, Sep. 12-15, 2005.