2019

*[69] Kihyun Kim, Kang-Hyun Kim, Chaesung Lim, Sungwon Yoo, Junsoo Kim, Min-Hee Cho, Satoru Yamada, M. Meyyappan, Chang-Ki Baek, Physical characteristics and data retention properties of 2-terminal thyristor-based random access memory (T-RAM) cell (under review), IEEE Transactions on Electron Devices, 2019. (IF: 2.704, Citation: 0)

*[68] Kihyun Kim, Sol Yoon, Myunghae Seo, Seungho Lee, Hyeonsu Cho, M. Meyyappan, Chang-Ki Baek, Enhanced photoresponse of hourglass-shaped silicon nanowire photodiodes with whispering-gallery-modes (Accepted), Nature Electronics, 2019. (IF: -, Citation: 0)

*[67] Myunghae Seo, Kihyun Kim, Hyeonsu Cho, Sol Yoon, Byuong Don Kong, M. Meyyappan, Chang-Ki Baek, Weakly Tapered Silicon Nanopillar Resonators with Spatially Well-Seperated Whispering Gallery Modes for Si-Based Lasers, ACS Applied Nano Materials, 2, 8, 4852-4858, 2019. (IF: -, Citation: 0)

[66] Hyeonsu Cho, Kihyun Kim, M. Meyyappan, Chang-Ki Baek, LaF3 electrolyte-insulator-semiconductor sensor for detecting fluoride ions, Sensors and Actuators B: Chemical, 279, 183, 2019. (IF: 6.393, Citation: 1)

[65] Seungho Lee, Kihyun Kim, M. Meyyappan, Chang-Ki Baek, Vertical silicon nanowire thermoelectric modules with enhanced thermoelectric properties, Nano Letters, 19, 747, 2019. (IF: 12.080, Citation: 0)

*[64] Kihyun Kim, Hyeon-Tak Kwak, Hyeonsu Cho, Chang-Ki Baek, Design guidelines for high sensitivity ZnO nanowire gas sensors with Schottky contact, IEEE Sensors Journal, 19, 3, 2019. (IF: 2.617, Citation: 0)

2018

*[63] Hyunah Kwon, Jun-Sik Yoon, Yuna Lee, Dong Yeong Kim, Chang-Ki Baek, Jong Kyu Kim, An array of metal oxides nanoscale hetero p-n junctions toward designable and highly-selective gas sensors, Sensors and Actuators B: Chemical, 255, 1663, 2018. (IF: 6.393, Citation: 7)

[62] Bergoi Ibarlucea, Teuku Fawzul Akbar, Kihyun Kim, Taiuk Rim, Chang-Ki Baek, Alon Ascoli, Ronald Tetzlaff, Larysa Baraban, Gianaurelio Cuniberti, Ultrasensitive detection of Ebola matrix protein in a memristor mode, Nano Research, 11, 1057, 2018. (IF: 7.994, Citation: 9)

2017

[61] Sol Yoon, Kihyun Kim, Hyeonsu Cho, Jun-Sik Yoon, Myoung Jin Lee, M. Meyyappan, and Chang-Ki Baek, Polysilicon near-infrared photodetector with performance comparable to crystalline silicon devices, Optics Express, 25, 32910, 2017. (IF: 3.561, Citation: 0)

*[60] Jun-Sik Yoon, Kihyun Kim, M. Meyyappan, Chang-Ki Baek, Bandgap Engineering and Strain Effects of Core-shell Tunneling Field-effect Transistors, IEEE Transactions on Electron Devices, 65, 277, 2017. (IF: 2.704, Citation: 3)

[59] Eunhye Baek, Taiuk Rim, Julian Schütt, Chang-Ki Baek, Kihyun Kim, Larysa Baraban, and Gianaurelio Cuniberti, Negative Photoconductance in Heavily Doped Si Nanowire Field-Effect Transistors, Nano Letters, 17, 6727, 2017. (IF: 12.080, Citation: 13)

*[58] Joonyong Choi, Jun-Sik Yoon, Chang-Ki Baek, Investigation of DC Characteristics in Polysilicon Nanowire Tunneling Field-Effect Transistors, Journal of Nanoscience and Nanotechnology, 17, 3071, 2017. (IF: 1.354, Citation: 2)

*[57] Jun-Sik Yoon, Kihyun Kim, M. Meyyappan, Chang-Ki Baek, Optical characteristics of silicon-based asymmetric vertical nanowire photodetectors, IEEE Transaction on Electron Devices, 64, 2261, 2017. (IF: 2.704, Citation: 7)

*[56] Hyeonsu Cho, Kihyun Kim, Jun-Sik Yoon, Taiuk Rim, M. Meyyappan, Chang-Ki Baek, Optimization of Signal to Noise Ratio in Silicon Nanowire ISFET Sensors, IEEE Sensors Journal, 17, 2792, 2017. (IF: 2.617, Citation: 3)

*[55] Jun-Sik Yoon, Kihyun Kim, Chang-Ki Baek, Core-shell homojunction silicon vertical nanowire tunneling field-effect transistors, Nature Scientific Reports, 7, 41142, 2017. (IF: 4.525, Citation: 8)

[54] Bergoi Ibarlucea, Taiuk Rim, Chang-Ki Baek, J.A.G.M. de Visser, Larysa Baraban, and Gianaurelio Cuniberti, Nanowire sensors monitor bacterial growth kinetics and response to antibiotics, Lab on a Chip, 17, 4283, 2017. (IF: 6.914, Citation: 8)

2016

*[53] Jun-Sik Yoon, Kihyun Kim, Taiuk Rim, Chang-Ki Baek, Performance and Variations Induced by Single Interface Trap of Nanowire FETs at 7-nm Node, IEEE Transactions on Electron Devices, 64, 339, 2016. (IF: 2.207, Citation: 10)

*[52] Taiuk Rim, Kihyun Kim, Hyeonsu Cho, Wooju Jeong, Jun-Sik Yoon, Yumi Kim, M. Meyyappan, Chang-Ki Baek, Electrical Characteristics of Doped Silicon Nanowire Channel Field-Effect Transistor Biosensors, IEEE Sensors Journal, 17, 667, 2016. (IF: 2.617, Citation: 5)

[51] Jun-Sik Yoon, Chang-Ki Baek, Rock-Hyun Baek, Process-Induced Variations of 10-nm Node Bulk nFinFETs Considering Middle-of-Line Parasitics, IEEE Transactions on Electron Devices, 63, 3399, 2016. (IF: 2.704, Citation: 10)

*[50] Jun-Sik Yoon, Kihyun Kim, Taiuk Rim, Chang-Ki Baek, Variability study of Si nanowire FETs with different junction gradients, AIP Advances, 6, 015318, 2016. (IF: 1.579, Citation: 7)

[49] Hyeongwan Oh, Jungsik Kim, Junyoung Lee, Taiuk Rim, Chang-Ki Baek, Jeong-Soo Lee, Effects of single grain boundary and random interface traps on electrical variations of sub-30nm polysilicon nanowire structures, Microelectronic Engineering, 149, 113, 2016. (IF: 2.020, Citation: 7)

2015

[48] Eui-Young Jeong, Jun-Sik Yoon, Chang-Ki Baek, Ye-Ram Kim, Jae-Ho Hong, Jeong-Soo Lee, Rock-Hyun Baek, Yoon-Ha Jeong, Investigation of RC Parasitics Considering Middle-of-the-Line in Si-Bulk FinFETs for Sub-14-nm Node Logic Applications, IEEE Transactions on Electron Devices, 62, 3441, 2015. (IF: 2.704, Citation: 4)

[47] Jin-Woo Han, Taiuk Rim, Chang-Ki Baek, M. Meyyappan, Chemical Gated Field Effect Transistor by Hybrid Integration of One-Dimensional Silicon Nanowire and Two-Dimensional Tin Oxide Thin Film for Low Power Gas Sensor, ACS Applied Materials and Interfaces, 7, 21263, 2015. (IF: 8.456, Citation: 25)

[46] Jun-Sik Yoon, Eui-Young Jeong, Chang-Ki Baek, Ye-Ram Kim, Jae-Ho Hong, Jeong-Soo Lee, Rock-Hyun Baek, Yoon-Ha Jeong, Junction Design Strategy for Si Bulk FinFETs for System-on-Chip Applications Down to the 7-nm Node, IEEE Electron Device Letters, 36, 994, 2015. (IF: 2.704, Citation: 13)

[45] Jungsik Kim, Hyeongwan Oh, Junyoung Lee, Chang-Ki Baek, M. Meyyappan, Jeong-Soo Lee, Three-dimensional simulation of threshold voltage variations due to an oblique single grain boundary in sub-40 nm polysilicon nanowire FETs, Semiconductor Science and Technology, 30, 085015, 2015. (IF: 2.654, Citation: 4)

*[44] Myung-Dong Ko, Taiuk Rim, Kihyun Kim, M. Meyyappan, Chang-Ki Baek, High efficiency silicon solar cell based on asymmetric nanowire, Nature Scientific Reports, 5, 11646, 2015. (IF: 4.525, Citation: 35)

*[43] Jun-Sik Yoon, Taiuk Rim, Jungsik Kim, Kihyun Kim, Chang-Ki Baek, Yoon-Ha Jeong, Statistical variability study of random dopant fluctuation on gate-all-around inversion-mode silicon nanowire field-effect transistors, Applied Physics Letters, 106, 103507, 2015. (IF: 3.521, Citation: 20)

2014

[42] Taiuk Rim, Chang-Ki Baek, M. Meyyappan, Optimized operation of silicon nanowire field effect transistor sensors, IOP Nanotechnology, 50, 505501, 2014. (IF: 3.821, Citation: 7)

[41] Seongwook Choi, Sooyoung Park, Chang-Ki Baek, Young June Park, Universal relaxation characteristic of interface trap under FN and NBTI stress in pMOSFET device, Electronic Letters, 25, 1877, 2014. (IF: 1.232, Citation: 0)

*[40] Jun-Sik Yoon, Taiuk Rim, Jungsik Kim, M. Meyyappan, Chang-Ki Baek, Yoon-Ha Jeong, Vertical gate-all-around junctionless nanowire transistors with asymmetric diameters and underlap lengths, Applied Physics Letters, 105, 102105, 2014. (IF: 3.521, Citation: 16)

[39] Daegun Kang, Taiuk Rim, Chang-Ki Baek, M. Meyyappan, Jeong-Soo Lee, Thermally Phase-Transformed In2Se3 Nanowires for Highly Sensitive Photodetectors, Small, 10, 3795, 2014. (IF: 10.856, Citation: 9)

[38] Jungsik Kim, Taiuk Rim, Junyoung Lee, Chang-Ki Baek, M. Meyyappan, Jeong-Soo Lee, Threshold Voltage Variations Due to Oblique Single Grain Boundary in Sub-50-nm Polysilicon Channel, IEEE Transactions on Electron Devices, 61, 2705, 2014. (IF: 2.704, Citation: 6)

*[37] Sang-Hyun Lee, Ye-Ram Kim, Jae-Ho Hong, Eui-Young Jeong, Jun-Sik Yoon, Chang-Ki Baek, Dong-Won Kim, Jeong-Soo Lee, Yoon-Ha Jeong, Investigation of Low-Frequency Noise in p-type Nanowire FETs: Effect of Switched Biasing Condition and Embedded SiGe Layer, IEEE Electron Device Letters, 35, 702, 2014. (IF: 2.620, Citation: 3)

[36] Mehrdad Shaygan, Keivan Davami, Nazli Kheirabi, Chang-Ki Baek, Gianaurelio Cuniberti, M. Meyyappan, Jeong-Soo Lee, Single-crystalline CdTe nanowire field effect transistors as nanowire-based photodetector, Physical Chemistry Chemical Physics, 16, 22687, 2014. (IF: 3.906, Citation: 34)

[35] Taiuk Rim, Chang-Ki Baek, Kihyun Kim, Yoon-Ha Jeong, Jeong-Soo Lee, M. Meyyappan, Silicon Nanowire Biologically Sensitive Field Effect Transistors: Electrical Characteristics and Applications, Journal of Nanoscience and Nanotechnology, 14, 273, 2014. (IF: 1.354, Citation: 14)

(Before POSTECH professor appointment)

2013

[34] Daegun Kang, Taiuk Rim, Chang-Ki Baek, M. Meyyappan, Jeong-Soo Lee, Investigation of electro-migration in In2Se3 nanowire for phase change memory devices, Applied Physics Letters, 103, 233504, 2013. (IF: 2.620, Citation: 9)

*[33] Myung-Dong Ko, Chang-Woo Sohn, Chang-Ki Baek, Yoon-Ha Jeong, A study on scaling length model for tapered tri-gate FinFET based on 3-D simulation and analytical analysis, IEEE Transactions on Electron Devices, 60, 2721, 2013. (IF: 2.704, Citation: 27)

*[32] Taiuk Rim, Kihyun Kim, Sungho Kim, Chang-Ki Baek, M. Meyyappan, Yoon-Ha Jeong, Jeong-Soo Lee, Improved electrical characteristics of honeycomb-nanowire ISFETs, IEEE Electron Device Letters, 34, 1059, 2013. (IF: 2.620, Citation: 17)

*[31] Ye-Ram Kim, Chang-Ki Baek, Sang-Hyun Lee, Chang-Woo Sohn, Do-Young Choi, Hyun-Chul Sagong, Sungho Kim, Eui-Young Jeong, Dong-Won Kim, Hyeongsun Hong, Jeong-Soo Lee, Yoon-Ha Jeong, Simple source/drain series resistance extraction method optimized for nanowire, IEEE Electron Device Letters, 34, 828, 2013. (IF: 2.620, Citation: 5)

[30] Chang-Woo Sohn, Chang Yong Kang, Myung-Dong Ko, Do-Young Choi, Hyun Chul Sagong, Eui-Young Jeong, Chan-Hoon Park, Sang-Hyun Lee, Ye-Ram Kim, Chang-Ki Baek, Jeong-Soo Lee, Jack C. Lee, Yoon-Ha Jeong, Analytical model of S/D series resistance in Trigate FinFETs with polygonal epitaxy, IEEE Transactions on Electron Devices, 60, 1302, 2013. (IF: 2.704, Citation: 18)

*[29] Chang-Ki Baek, Daegun Kang, JeongSik Kim, Bo Jin, Taiuk Rim, Sooyoung Park, M. Meyyappan, Yoon-Ha Jeong, Jeong-Soo Lee, Improved preformance of In2Se3 nanowire phase-change memory with SiO2 passivation, Solid-State Electronics, 80, 10, 2013. (IF: 1.492, Citation: 15)

[28] Taiuk Rim, Kihyun Kim, Nanki Hong, Wooree Ko, Chang-Ki Baek, Sangmin Jeon, M. Jamal Deen, M. Meyyappan, Yoon-Ha Jeong, Jeong-Soo Lee, Investigation of the electrical stability of Si-nanowire biologically sensitive field-effect transistors with embedded Ag/AgCl pseudo reference electrode, RCS Advances, 3, 7963, 2013. (IF: 3.049, Citation: 19)

*[27] Sang-Hyun Lee, Chang-Ki Baek, Sooyoung Park, Dong-Won Kim, Dong Kyun Sohn, Jeong-Soo Lee, Dae M. Kim, Yoon-Ha Jeong, Characterization of channel diameter dependent low frequency noise in silicon nanowire field effect transistors, IEEE Electron Device Letters, 33, 1348, 2013. (IF: 2.620, Citation: 17)

2012

*[26] Chang-Ki Baek, Sooyoung Park, Myung-Dong Ko, Taiuk Rim, Seongwook Choi, Yoon-Ha Jeong, Characteristics of gate-all-around silicon nanowire field effect transistors with asymmetric channel width and source/drain doping concentration, Journal of Applied Physics, 112, 034513, 2012. (IF: 2.328, Citation: 12)

[25] Chang-Woo Sohn, Chang Yong Kang, Rock-Hyun Baek, Do-Young Choi, Hyun Chul Sagong, Eui-Young Jeong, Chang-Ki Baek, Jeong-Soo Lee, Jack C. Lee, Yoon-Ha Jeong, Device design guidelines for nanoscale FinFETs in RF/Analog applications, IEEE Electron Device Letters, 33, 1234, 2012. (IF: 2.620, Citation: 13)

[24] Chan-Hoon Park, Myung-Dong Ko, Ki-Hyun Kim, Rock-Hyun Baek, Chang-Woo Sohn, Chang-Ki Baek, Sooyoung Park, M. Jamal Deen, Yoon-Ha Jeong, Jeong-Soo Lee, Electrical characteristics of 20-nm junctionless Si nanowire transistors, Solid-State Electronics, 73, 7, 2012. (IF: 1.492, Citation: 94)

*[23] Myung-Dong Ko, Chang-Ki Baek, Taiuk Rim, Sooyoung Park, Yoon-Ha Jeong, Optical and electrical characteristics of asymmetric nanowire solar cells, Journal of Applied Physics, 111, 073102, 2012. (IF: 2.328, Citation: 9)

2011

[22] Hyun Chul Sagong, Chang Yong Kang, Chang-Woo Sohn, Kanghoon Jeon, Eui-Young Jeong, Do-Young Choi, Chang-Ki Baek, Jeong-Soo Lee, Jack C. Lee, Yoon-Ha Jeong, Comprehensive Study of Quasi-Ballistic Transport in High-k/Metal Gate nMOSFETs, IEEE Electron Device Letters, 32, 11474, 2011. (IF: 2.620, Citation: 3)

[21] Hyun Chul Sagong, Chang Yong Kang, Chang-Woo Sohn, Do-Young Choi, Eui-Young Jeong, Chang-Ki Baek, Jeong-Soo Lee, Yoon-Ha Jeong, New Investigation of Hot Carrier Degradation on RF Small-Signal Parameter and Performance in High-k/Metal Gate nMOSFET, IEEE Electron Device Letters, 32, 1668, 2011. (IF: 2.620, Citation: 3)

[20] Do-Young Choi, Kyong Taek Lee, Chang-Ki Baek, Chang Woo Sohn, Hyun Chul Sagong, Eui-Young Jung, Jeong-Soo Lee, Yoon-Ha Jeong, Interfacial-Layer-Driven Dielectric Degradation and Breakdown of HfSiON/SiON Gate Dielectric nMOSFETs, IEEE Electron Device Letters, 32, 1319, 2011. (IF: 2.620, Citation: 6)

*[19] Sooyoung Park, Chang-Ki Baek, Hong-Hyun Park, SeongWook Choi, Young June Park, A 3-D Statistical Simulation Study of Mobility Fluctuations in MOSFET induced by Discrete Trapped Charges in SiO2 layer, IEEE Transactions on Nanotechnology, 10, 699, 2011. (IF: 2.857, Citation: 1)

*[18] Rock-Hyun Baek, Chang-Ki Baek, Hyun-Sik Choi, Jeong-Soo Lee, Yun Young Yeoh, Kyoung Hwan Yeo, Dong-Won Kim, Kinam Kim, Dae M. Kim, Yoon-Ha Jeong, Characterization and modeling of 1/f noise in Si-nanowire FETs: effects of cylindrical geometry and different processing of oxides, IEEE Transactions on Nanotechnology, 10, 417, 2011. (IF: 2.857, Citation: 20)

*[17] Rock-Hyun Baek, Chang-Ki Baek, Sang-Hyun Lee, Sung Dae Suk, Ming Li, Yun Young Yeoh, Kyoung Hwan Yeo, Dong-Won Kim, Jeong-Soo Lee, Dae M. Kim, Yoon-Ha Jeong, C-V Characteristics in Undoped Gate-All-Around Nanowire FET Array, IEEE Electron Device Letters, 32, 116, 2011. (IF: 2.620, Citation: 10)

*[16] SeongWook Choi, Chang-Ki Baek, Sooyoung Park, Young June Park, An Analysis of the Field Dependence of Interface Trap Generation under Negative Bias Temperature Instability Stress using Wentzel-Kramers Brillouin with Density Gradient Method, Japanese Journal of Applied Physics, 50, 014302, 2011. (IF: 1.471, Citation: 2)

[15] Do-Young Choi, Kyong Taek Lee, Chang-Ki Baek, Chang Woo Sohn, Hyun Chul Sagong, Eui-Young Jung, Jeong-Soo Lee, Yoon-Ha Jeong, Silicon and Column IV Semiconductor Devices Interfacial Layer Driven Dielectric Degradation and Breakdown of HfSiON/SiON Gate Dielectric nMOSFETs, IEEE Electron Device Letters, 32, 1319, 2011. (IF: 2.620, Citation: 0)

[14] Sungho Kim, Taiuk Rim, Kihyun Kim, Unsang Lee, Eunhye Baek, Hojoon Lee, Chang-Ki Baek, M. Meyyappan, M. Jamal Deen, Jeong-Soo Lee, Silicon nanowire ion sensitive field effect transistor with integrated Ag/AgCl electrode: pH sensing and noise characteristics, Analyst, 136, 5012, 2011. (IF: 3.864, Citation: 57)

2010

[13] Rock-Hyun Baek, Chang-Ki Baek, Sung-Woo Jung, Yun Young Yeoh, Dong-Won Kim, Jeong-Soo Lee, Dae M. Kim, Yoon-Ha Jeong, Comparison of Series Resistance and Mobility Degradation Extracted from n- and p-type Si-NWFETs Using the Y-function Technique, Japanese Journal of Applied Physics, 49, 04DN06, 2010. (IF: 1.471, Citation: 6)

[12] Rock-Hyun Baek, Chang-Ki Baek, Sung-Woo Jung, Yun Young Yeoh, Dong-Won Kim, Jeong-Soo Lee, Dae M. Kim, Yoon-Ha Jeong, Characteristics of the Series Resistance Extracted From Si Nanowire FETs Using the Y-function technique, IEEE Transactions on Nanotechnology, 9, 212, 2010. (IF: 2.857, Citation: 27)

2009

*[11] Myoung Jin Lee, Chang-Ki Baek, Sooyoung Park, In-Young Chung, Young June Park, A Comparative Study of the DRAM Leakage Mechanism for Planar and Recessed Channel MOSFETs, Solid-State Electronics, 53, 998, 2009. (IF: 1.492, Citation: 5)

2008

[10] Younghwan Son, Chang-Ki Baek, In-Shik Han, Han-Soo Joo, Tae-Gyu Goo, Ooksang Yoo, Wonho Choi, Hee-Hwan Ji, Hi-Deok Lee, Dae M. Kim, Characterization of Near-Interface Oxide Trap Density in Nitrided Oxides for Nano-Scale MOSFET Applications, IEEE Transactions on Nanotechnology, 8, 654, 2008. (IF: 2.857, Citation: 4)

[9] Bomsoo Kim, Wookhyun Kwon, Chang-Ki Baek, Seonghoon Jin, Yunheub Song, Dae M. Kim, Three-Dimensional Simulation of Dopant-Fluctuation-Induced Threshold Voltage Dispersion in Nonplanar MOS Structures Targeting Flash EEPROM Transistors, IEEE Transactions on Electron Devices, 55, 1456, 2008. (IF: 2.704, Citation: 3)

2007

[8] Myoung Jin Lee, Seonghoon Jin, Chang-Ki Baek, Sung-Min Hong, Soo-Young Park, Hong-Hyun Park, Sang-Don Lee, Sung-Woong Chung, Jae-Goan Jeong, Sung-Joo Hong, Sung-Wook Park, In-Young Chung, Young June Park, Hong Shick Min, A Proposal on an Optimized Device Structure With Experimental Studies on Recent Devices for the DRAM Cell Transistor, IEEE Transactions on Electron Devices, 54, 3325, 2007. (IF: 2.704, Citation: 115)

2006

[7] Bomsoo Kim, Wook-Hyun Kwon, Chang-Ki Baek, Younghwan Son, Chan-Kwang Park, Kinam Kim, Dae M. Kim, Correction to “Edge Profile Effect of Tunnel Oxide on Erase Threshold Voltage Distributions in Flash Memory Cells, IEEE Transactions on Electron Devices, 53, 3012, 2006. (IF: 2.704)

[6] Bomsoo Kim, Wook-Hyun Kwon, Chang-Ki Baek, Younghwan Son, Chan-Kwang Park, Kinam Kim, Dae M. Kim, Edge Profile Effect of Tunnel Oxide on Erase Threshold Voltage Distributions in Flash Memory Cells, IEEE Transactions on Electron Devices, 53, 3012, 2006. (IF: 2.704, Citation: 10)

*[5] Chang-Ki Baek, Bomsoo Kim, Younghwan Son, Wookhyun Kwon, Chan-Kwang Park, Young June Park, Hong Shick Min, Dae M. Kim, Reliable Extraction of Cycling Induced Interface States Implementing Realistic P/E Stresses in Reference Cell: Comparison with Flash Memory Cell, IEEE Electron Device Letters, 27, 169, 2006. (IF: 2.620, Citation: 4)

2005

*[4] Chang-Ki Baek, Bomsoo Kim, Wu-yun Quan, Wookhyun Kwon, Young June Park, Hong Shick Min, Design Technique for Ramped Gate Soft-Programming in Over-Erased NOR Type Flash EEPROM Cells, Japanese Journal of Applied Physics, 44, 578, 2005. (IF: 1.471, Citation: 0)

2004

[3] Bomsoo Kim, Chang-Ki Baek, Wookhyun Kwon, Jawoong Lee, Yoon-Ha Jeong, Dae M. Kim, Spatial and Temporal Characterization of Programming Charge in SONOS Memory Cell: Effects of Localized Electron Trapping, Japanese Journal of Applied Physics, 43, 1581, 2004. (IF: 1.471, Citation: 3)

*[2] Chang-Ki Baek, Yunheub Song, Bomsoo Kim, Wu-yun Quan, Young June Park, Hong Shick Min, Dae M. Kim, High Speed, Low Power Programming in 0.17μm Channel Length NOR-type Floating Gate Flash Memory Cell Free of Drain Turn-On Effects, Japanese Journal of Applied Physics, 43, 224, 2004. (IF: 1.471, Citation: 0)

[1] Bomsoo Kim, Chang-Ki Baek, Wookhyun Kwon, Yoon-Ha Jeong, Dae M. Kim, Simple Experimental Determination of the Spread of Trapped Hot Holes Injected in Silicon – Oxide – Nitride – Oxide – Silicon (SONOS) Cells: Optimized Erase and Cell Shrinkage, Japanese Journal of Applied Physics, 43, 1611, 2004. (IF: 1.471), Citation: 4)