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J. Kim, H.G. Oh, T. Rim, C.-K. Baek, J.-S. Lee, "Various Heterojunction Single Gate Tunneling FETs with Graded Channel Doping i

J. Kim, B. Jin, H. Oh, C.-K. Baek, J.-S. Lee, "The Statistical Distribution of Electrical Characteristics with Ramdom Grain Bou

J. Kim, H.G. Oh, J. Lee, J.W. Kim, C.-K. Baek, J.-S. Lee, "3D Simulation of Threshold Voltage Variations Due to Random Grain Bo

J.H.Cho, D.K.Kang, S.B.Jeong, C.K.Baek , M.Meyyappan, and J.S.Lee, "In2Se3 나노선 합성 및 이를 이용한 상변화메모리소자의 전기적 특성 분석", 제18회 한국반도체학술대회

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SeongWook Choi, Chang-Ki Baek , Sooyoung Park and Young June Park, “Universality in the interface Trap Relaxation of NBTI and F

이상현, 백록현, 백창기, 박찬훈, 고명동, 여경환, 김동원, 김대만, 정윤하, “Investigation of GIDL Behavior in Si-Nanowire FET with Hot Carrier Stress”, 18th

SeongWook Choi, Chang-Ki Baek , Sooyoung Park and Young June Park, “3D Simulation of NBTI in pMOSFET’s including discrete inter