J. Kim, B. Jin, H. Oh, C.-K. Baek, J.-S. Lee, "The Statistical Distribution of Electrical Characteristics with Ramdom Grain Bou

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2017-04-20 13:06
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J. Kim, B. Jin, H. Oh, C.-K. Baek, J.-S. Lee, "The Statistical Distribution of Electrical Characteristics with Ramdom Grain Boundary in Vertical NAND Unit Cells", 22th KCS, Feb., 2015
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Hyeonsu Cho, Wooju jeong, Joonyoung Choi, Myung-Hae Seo, Sol Yoon, Seung-Ho Lee, Taiuk Rim, Chang-Ki Baek, "도핑 농도에 따른 나노선 ISFET
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J. Kim, H.G. Oh, T. Rim, C.-K. Baek, J.-S. Lee, "Various Heterojunction Single Gate Tunneling FETs with Graded Channel Doping i
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J. Kim, B. Jin, H. Oh, C.-K. Baek, J.-S. Lee, "The Statistical Distribution of Electrical Characteristics with Ramdom Grain Bou
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J. Kim, H.G. Oh, J. Lee, J.W. Kim, C.-K. Baek, J.-S. Lee, "3D Simulation of Threshold Voltage Variations Due to Random Grain Bo
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J.H.Cho, D.K.Kang, S.B.Jeong, C.K.Baek , M.Meyyappan, and J.S.Lee, "In2Se3 나노선 합성 및 이를 이용한 상변화메모리소자의 전기적 특성 분석", 제18회 한국반도체학술대회
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K.H.Kim, S.H.Kim, T.U.Rim, D.H.Cho, S.H.Sagong, C.K.Baek , M.Meyyappan, Y.H.Jeong, and J.S.Lee, "실리콘 나노선을 이용한Ion-Sensitive Fiel
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SeongWook Choi, Chang-Ki Baek , Sooyoung Park and Young June Park, “Universality in the interface Trap Relaxation of NBTI and F
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이상현, 백록현, 백창기, 박찬훈, 고명동, 여경환, 김동원, 김대만, 정윤하, “Investigation of GIDL Behavior in Si-Nanowire FET with Hot Carrier Stress”, 18th
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SeongWook Choi, Chang-Ki Baek , Sooyoung Park and Young June Park, “3D Simulation of NBTI in pMOSFET’s including discrete inter
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박수영, 백창기, 최성욱, 박영준, “DD based modeling of mobility by discrete charges in scaled MOSFETs”, 17th Korean Conference on Semiconduc
baekck | 2017.04.20 | 추천 0 | 조회 15
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