J. Kim, B. Jin, H. Oh, C.-K. Baek, J.-S. Lee, "The Statistical Distribution of Electrical Characteristics with Ramdom Grain Bou
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2017-04-20 13:06
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J. Kim, B. Jin, H. Oh, C.-K. Baek, J.-S. Lee, "The Statistical Distribution of Electrical Characteristics with Ramdom Grain Boundary in Vertical NAND Unit Cells", 22th KCS, Feb., 2015