Myung-Dong Ko, Chang-Woo Sohn, Chang-Ki Baek*, and Yoon-Ha Jeong, “A Study on a Scaling Length Model for Tapered Tri-gate FinFE

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2017-04-20 12:24

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Myung-Dong Ko, Chang-Woo Sohn, Chang-Ki Baek*, and Yoon-Ha Jeong, “A Study on a Scaling Length Model for Tapered Tri-gate FinFET based on 3-D Simulation and Analytical Analysis," IEEE Transactions on Electron Devices, Jul. 2013

http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6566035

« Taiuk Rim, Ki-HyunKim, Sungho Kim, Chang-Ki Baek*,Meyya Meyyappan, Yoon-Ha Jeong, and Jeong-Soo Lee, "Improved Electrical Chara

Daegun Kang, Taiuk Rim, Chang-Ki Baek*, M. Meyyappan, and Jeong-Soo Lee, “Investigation of electro-migration in In2Se3 nanowire »

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전체 53

번호	제목	작성자	작성일	추천	조회
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44	Jin-Woo Han, Taiuk Rim, Chang-Ki Baek, and M Meyyappan, "Chemical Gate Field Effect Transistor by Hybrid Interation of One-Dime baekck \| 2017.04.20 \| 추천 0 \| 조회 13	baekck	2017.04.20	0	13