Domestic Conference – POSTECH IDEA LAB

2023

[43] Minkeun Choi, Hyeon-Tak Kwak, Chang-Ki Baek, “Investigating corrugated sidewall effect of silicon nanopillars on near-infrared photodetector”, 2023 The Institute of Semiconductor Engineers(ISE) Summer Conference, Jul. 17-19, 2023.

[42] Yijoon Kim, Hyangwoo Kim, Chang-Ki Baek, “Highly biomimetic integrate-and-fire neuron circuit based on SiGe resistive switching transistors”, 2023 The Institute of Semiconductor Engineers(ISE) Summer Conference, Jul. 17-19, 2023.

2022

[41] Hyeon-Tak Kwak, Chang-Ki Baek, “Silicon nanosheet FET gas sensor for room-temperature hydrogen fluoride gas detection”, 2022 The Institute of Semiconductor Engineers (ISE) Summer Conference, Jul. 11-13, 2022.

[40] Yijoon Kim, Hyangwoo Kim, Chang-Ki Baek, “Schottky Barrier based Double PN Junction Synapse with SONOS Structure”, 29th Korean Conference on Semiconductors, Gangwon, Feb. 24-26, 2022.

[39] Kyounghwan Oh, Hyangwoo Kim, Chang-Ki Baek, “High-Voltage FinFET with Superior DC/RF Performance using Dual Material Gate and High-k Field Plate”, 29th Korean Conference on Semiconductors, Gangwon, Feb. 24-26, 2022.

2021

[38] Hyeon-Tak Kwak, Hyeonsu Cho, Chang-Ki Baek, “고감도 불소 이온 검출을 위한 실리콘 나노시트 채널 구조 기반 ISFET 센서”, The Institute of Semiconductor Engineers(ISE) Summer Conference, Jul. 12-14, 2021.

[37] Kyounghwan Oh, Hyangwoo Kim, Myunghae Seo, Seungho Lee, Hyeonsu Cho, Chang-Ki Baek, “Breakdown Mechanism Analysis and Optimization of High Voltage FinFET with High-k Dielectric Field Plate”, 2021 IEIE Summer Conference, Jeju, Jun. 30-Jul. 2, 2021.

[36] Hyangwoo Kim, Hyeonsu Cho, Myunghae Seo, Seungho Lee, Byoung Don Kong, Chang-Ki Baek, “Highly Reliable Three-terminal Thyristor Random Access Memory with Excellent Retention Characteristics”, 2021 IEIE Summer Conference, Jeju, Jun. 30-July. 02, 2021.

[35] Hyeon-Tak Kwak, Hyeonsu Cho, Chang-Ki Baek, “Silicon Nanosheet ISFET Sensor based on Poly-LaF3 Sensing Membrane for Highly Sensitive Fluoride ion Detection”, 28th Korean Conference on Semiconductors, Gangwon, Jan. 25-29, 2021.

2020

[34] Hyangwoo Kim, Hyeonsu Cho, Chang-Ki Baek, “Analysis of 2-terminal Random Access Memory with PN junction for Scaling and Data Retention”, The 3rd ISE Conference, Seoul, Dec. 16, 2020.

[33] Hyangwoo Kim, Hyeonsu Cho, Minkeun Choi, Byoung Don Kong, Chang-Ki Baek, “Analysis of 2-terminal Thyristor-based Random Access Memory (T-RAM) Characteristics for Scaling and Data Retention”, 2020 IEIE Summer Conference, Jeju, Aug. 19-21, 2020.

[32] Hyeongseok Yoo, Seungho Lee, Chang-Ki Baek, “Improved Thermoelectric Properties of Silicon Nanowire with Silicide Layer”, 27th Korean Conference on Semiconductors, Gangwon, Feb. 12-14, 2020.

[31] Hyangwoo Kim, Hyeonsu Cho, Chang-Ki Baek, “High-voltage FinFET device with a high-k dielectric field plate”, 27th Korean Conference on Semiconductors, Gangwon, Feb. 12-14, 2020.

[30] Hyeon-Tak Kwak, Hyeonsu Cho, Chang-Ki Baek, “Highly Accurate Fluoride ion Detection in Tap Water with Diluted Buffer Solution”, 27th Korean Conference on Semiconductors, Gangwon, Feb. 12-14, 2020.

2019

[29] Hyeon-Tak Kwak, Hyeonsu Cho, Kihyun Kim, Chang-Ki Baek, “Optimization of Silicon Nanowire ISFET Sensor for Sensitive Detection of Fluoride Ion”, 26th Korean Conference on Semiconductors, Gangwon, Feb. 13-15, 2019.

[28] Chaesung Lim, Sol Yoon, Kihyun Kim, Chang-Ki Baek, “Design Optimization of Silicon Single Photon Avalanche Diode with for High Photon Detection and Low Crosstalk Probabilities”, 26th Korean Conference on Semiconductors, Gangwon, Feb. 13-15, 2019.

2018

[27] Myunghae Seo, Kihyun Kim, Chang-Ki Baek, “Photoluminescence Characteristics of Silicon Nanopillar Structures”, 25th Korean Conference on Semiconductors, Gangwon, Feb. 5-7, 2018.

[26] Hyeonsu Cho, Kihyun Kim, Chang-Ki Baek, “EIS sensor for fluoride ion detection based on LaF3 film”, 25th Korean Conference on Semiconductors, Gangwon, Feb. 5-7, 2018.

2017

[25] Wooju Jeong, Jun-Sik Yoon, Kihyun Kim, Chang-Ki Baek, “Gas sensitivity variation with different defect density and dimensions in single ZnO nanowire gas sensor”, 24th Korean Conference on Semiconductors, Gangwon, Feb. 13-15, 2017.

[24] Sol Yoon, Kihyun Kim, Junsik Yoon, Chang-Ki Baek, “The investigation of the responsivity on silicon photodetector depend on deposition technique”, 24th Korean Conference on Semiconductors, Gangwon, Feb. 13-15, 2017.

[23] Seungho Lee, Kihyun Kim, Jun-Sik Yoon, Chang-Ki Baek, “Differential 3w method for measuring thermal conductivity of silicon nanowire”, 24th Korean Conference on Semiconductors, Gangwon, Feb. 13-15, 2017.

[22] Joonyong Choi, Jun-Sik Yoon, Kihyun Kim, Chang-Ki Baek, “DC characteristics in polysilicon nanowire tunneling field-effect transistors”, 24th Korean Conference on Semiconductors, Gangwon, Feb. 13-15, 2017.

2016

[21] Hyeonsu Cho, Wooju jeong, Joonyoung Choi, Myung-Hae Seo, Sol Yoon, Seung-Ho Lee, Taiuk Rim, Chang-Ki Baek, “Noise Characterization of Nanowire ISFET Sensor with Doping concentration”, 2016 IEIE Summer Conference, Jeju, Jun. 22-24, 2016.

2015

[20] J. Kim, H.G. Oh, T. Rim, Chang-Ki Baek, J.-S. Lee, “Various Heterojunction Single Gate Tunneling FETs with Graded Channel Doping in Sub-40 nm Channels”, 22th Korean Conference on Semiconductors, Incheon, Feb. 10-12, 2015.

[19] J. Kim, B. Jin, H. Oh, Chang-Ki Baek, J.-S. Lee, “The Statistical Distribution of Electrical Characteristics with Ramdom Grain Boundary in Vertical NAND Unit Cells”, 22th Korean Conference on Semiconductors, Incheon, Feb. 10-12, 2015.

2014

[18] J. Kim, H.G. Oh, J. Lee, J.W. Kim, Chang-Ki Baek, J.-S. Lee, “3D Simulation of Threshold Voltage Variations Due to Random Grain Boundary and Discrete Dopants in Sub-20 nm Gate-All-Around Poly-Si Transistors”, 21th Korean Conference on Semiconductors, Seoul, Feb. 24-26, 2014.

(Before POSTECH professor appointment)

2011

[17] J.H. Cho, D.K. Kang, S.B. Jeong, Chang-Ki Baek, M. Meyyappan, J.S. Lee, “In₂Se₃ Nanowire synthesis and its properties on phase-shift memory ”, 18th Korean Conference on Semiconductors, Jeju, Feb. 16-18, 2011.

[16] K. H. Kim, S. H. Kim, T. U. Rim, D. H. Cho, S. H. Sagong, Chang-Ki Baek, M. Meyyappan, Y.H. Jeong, J.S. Lee, “Properties of Ion-Sensitive Field Effect Transistor using silicon nanowre”, 18th Korean Conference on Semiconductors, Jeju, Feb. 16-18, 2011.

[15] SeongWook Choi, Chang-Ki Baek, Sooyoung Park and Young June Park, “Universality in the interface Trap Relaxation of NBTI and FN Stress: Measurement by Subthreshold Slope Method on nMOSFET and Its Modeling”, 18th Korean Conference on Semiconductors, Jeju, Feb. 16-18, 2011.

[14] J.-S. Lee, R. H. Baek, Chang-Ki Baek, C. H. Park, M. D. Ko, K. H. Yeo, D.-W. Kim, Dae M. Kim, Y.H. Jeong, “Investigation of GIDL Behavior in Si-Nanowire FET with Hot Carrier Stress”, 18th Korean Conference on Semiconductors, Jeju, Feb. 16-18, 2011.

2010

[13] SeongWook Choi, Chang-Ki Baek, Sooyoung Park, Young June Park, “3D Simulation of NBTI in pMOSFET’s including discrete interface and oxide traps generation”, 17th Korean Conference on Semiconductors, Deagu, Feb. 3-5, 2010.

[12] Sooyoung Park, Chang-Ki Baek, SeongWook Choi and Young June Park, “DD based modeling of mobility by discrete charges in scaled MOSFETs”, 17th Korean Conference on Semiconductors, Deagu, Feb. 3-5, 2010.

[11] R. H. Baek, Chang-Ki Baek, H.-S. Choi, J.-S. Lee, Y. Y. Yeoh, K. H. Yeo, D.-W. Kim, Kinam Kim, Dae M. Kim, Y. H. Jeong, “Accurate Extraction of Volume Trap Density from Si-Nanowire FET using the Newly Developed Cylindrical Coordinate Based 1/f noise model”, 17th Korean Conference on Semiconductors, Deagu, Feb. 3-5, 2010.

2009

[10] SeongWook Choi, Chang-Ki Baek, Sooyoung Park, and Young June Park, “The simulation of the pMOSFET degradation under NBTI using Si-SiO2 interface trap generation model based on Quantum mechanical simulation”, 2009 IEIE Summer Conference, Jeju, Jul. 8-10, 2009.

[9] Sooyoung Park, Chang-Ki Baek, Hong-Hyun Park, SeongWook Choi and Young June Park, “Mobility Fluctuation on MOSFET Induced by Discrete Charges in the SiO2”, 2009 IEIE Summer Conference, Jeju, Jul. 8-10, 2009.

[8] Sooyoung Park, Chang-Ki Baek, Hong-Hyun Park, SeongWook Choi, Young June Park, “3D Statistical Simulation Study of Mobility Fluctuation on MOSFET Induced by a Single Charge in SiO2 layer”, 2009 IEIE Summer Conference, Jeju, Jul. 8-10, 2009.

2008

[7] Younghwan Son, Chang-Ki Baek, Bomsoo Kim, “Stress-Free AC Measurement Method for Programming current and Gate current extraction with the Negative Substrate Bias in Stacked gate NOR Flash EEPOM cell”, 15th Korean Conference on Semiconductors, Gangwon, Feb. 8-9, 2008.

[6] Younghwan Son, Chang-Ki Baek, In-Shik Han, Han-Soo Joo, Tae-Gyu Goo, Ooksang You, Wonho Choi, Hi-Deok Lee, and Dae M. Kim, “Oxide for Nano-Scale MOSFETs, Using Multi-Frequency and -Temperature Charge Pumping Technique: Not vs. Oxide Processing”, 15th Korean Conference on Semiconductors, Gangwon, Feb. 8-9, 2008.

[5] Myoung Jin Lee, Seonghoon Jin, Chang-Ki Baek, Soo-Young Park, Hong-Hyun Park, Sang-Don Lee, Sung-Woong Chung, Jae-Goan Jeong, Sung-Joo Hong, Sung-Wook Park, In-Young Chung, Young June Park, and Hong Shick Min, “Reliability Studies on Non Planar DRAM Cell Transistor”, 15th Korean Conference on Semiconductors, Gangwon, Feb. 8-9, 2008.

2006

[4] Chang-Ki Baek, Bomsoo Kim, Younghwan Son, Myoung Jin Lee, Dae M. Kim, Young June Park, and Hong Shick Min, “A Reliable Extraction Method of Cycling Induced Interface States by Implementing Realistic P/E Stresses in the Reference cell comparing with the Flash Memory Cell”, 13th Korean Conference on Semiconductors, Jeju, Feb. 23-24, 2006.

[3] Myoung Jin Lee, Chang-Ki Baek, Seonghoon Jin, In-Young Chung, Young June Park, and Hong Shick Min, “A New Recess-FINFET Structure (RFinFET) for DRAM Cell Applications”, 13th Korean Conference on Semiconductors, Jeju, Feb. 23-24, 2006.

[2] Myoung Jin Lee, Chang-Ki Baek, Seonghoon Jin, Kyu-Il Lee, In-Young Chung, Young June Park, Hong Shick Min, “A Simulation Study of the Depletion Type FINFET with Non-overlapped Source/Drain for DRAM Cell Applications”, 13th Korean Conference on Semiconductors, Jeju, Feb. 23-24, 2006.

2005

[1] Chang-Ki Baek, Young June Park, and Hong Shick Min, “Design Technique for Soft-Programming in NOR Type Flash E2PROM Cells”, 12th Korean Conference on Semiconductors, Seoul, Feb. 24-25, 2005.